Engineers doing squeak and rattle testing of instrument panels (IP's) have successfully used large electrodynamic vibration systems to identify sources of squeaks and rattles (S&R's). Their successes led to demands to test more IP's, i.e., to increase throughput of IP's to reflect the many design, material, and/or manufacturing process changes that occur, and to do so at any stage of the development, production, or QA process. What is needed is a radically different and portable way to find S&R's in a fraction of the time and at lower capital cost without compromising S&R detection results.


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    Title :

    “Next Generation” Means for Detecting Squeaks and Rattles in Instrument Panels


    Additional title:

    Sae Technical Papers


    Contributors:

    Conference:

    SAE Noise and Vibration Conference and Exposition ; 1997



    Publication date :

    1997-05-20




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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