This Standard establishes processes for documenting the mitigating steps taken to reduce the harmful effects of Pb-free tin finishes in electronic systems. This Standard is applicable to Aerospace, Defense, and High Performance (ADHP) electronic applications which procure equipment that may contain Pb-free tin finishes.
Standard for Mitigating the Effects of Tin Whiskers in Aerospace and High Performance Electronic Systems
2012-05-01
Conference paper
English
SAE Technical Papers | 2012
MITIGATING AND PREVENTING THE GROWTH OF TIN AND OTHER METAL WHISKERS ON CRITICAL HARDWARE
British Library Conference Proceedings | 2007
|Formation and evolution mechanism of metal whiskers in extreme aerospace environments: A review
Elsevier | 2023
|Online Contents | 1996
Aerospace electronic systems technology
Engineering Index Backfile | 1967