Vehicular communication systems faces several challenges at cell edges in specific, causing issues such as inter-cell interference (ICI), less reliability, and lower throughput. These limitations in urban environments intensify as connectivity among vehicles is not present due to absence of direct Line-of-Sight (LoS) path and are often referred as dark zones. To address these challenges, this paper proposes a novel reconfigurable intelligent surface (RIS)-assisted vehicle-to-infrastructure (V2I) network model explicitly for urban scenarios. This integration enhances signal strength and mitigates ICI effects, improving connectivity and overall system performance in the presence of dark zones. The primary objective of this research is to derive closed-form expressions for the ergodic capacity and downlink outage probability of the proposed system under Weibull fading channels. Leveraging the central limit theorem (CLT) and Taylor series expansion, the system's performance is analyzed, considering interference from neighboring cell’s roadside units (RSUs) and RISs. Theoretical derivations are validated through Monte Carlo simulations, demonstrating their accuracy. Results show that integrating RIS notably reduces interference power, enhances connectivity in dark zones, and improves reliability and throughput in V2I communication systems. This work provides a practical solution to key challenges in next-generation vehicular networks, paving the way for more robust and efficient urban communication systems.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    RIS-assisted V2I Communication for Inter-Cell Interference Mitigation Under Weibull Fading Channels


    Additional title:

    Int. J. ITS Res.


    Contributors:
    Reshma P (author) / Sudha, V. (author) / Rafi, R. M. (author)


    Publication date :

    2025-08-01


    Size :

    17 pages




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English