Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Yield Analysis of Optical MEMS Assembly Process Using a Monte Carlo Simulation Technique


    Contributors:
    Badreldin, T. (author) / Saad, T. (author) / Khalil, D. (author)

    Published in:

    Publication date :

    2005-01-01


    Size :

    7 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692



    Role of boundary conditions in Monte Carlo simulation of MEMS devices

    Nance, Robert / Hassan, H. / Hash, David | AIAA | 1997


    Role of Boundary Conditions in Monte Carlo Simulation of MEMS Devices

    Nance, R. P. / Hash, D. B. / Hassan, H. A. et al. | British Library Conference Proceedings | 1997


    Hall Effect Thrusters Ceramics Sputtering Yield determination by Monte Carlo Simulation

    Tondu, Thomas / Viel-Inguimbert, V / Roussel, J-F et al. | AIAA | 2008


    Use of Monte Carlo simulation technique in accident reconstruction

    Kos,G. / Werner,S.M. / Failure Analysis Ass.,US | Automotive engineering | 1994


    Probabilistic Reanalysis Using Monte Carlo Simulation

    Nikolaidis, E. / Saleem, S. / Farizal et al. | British Library Conference Proceedings | 2008