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    Title :

    Modeling Defect Enhanced Detection at 1550 nm in Integrated Silicon Waveguide Photodetectors


    Contributors:
    Logan, D.F. (author) / Jessop, P.E. (author) / Knights, A.P. (author)

    Published in:

    Publication date :

    2009-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692



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