Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    A Serial Optical Link Based Memory Test System for High-Speed and Multi-Parallel Test


    Contributors:
    Lee, S.-H. (author) / Cho, S. (author) / Song, K.-J. (author) / Byun, E.-J. (author) / Joo, S. (author) / Suh, S.-D. (author) / Ha, K. (author) / Oh, S.-J. (author) / Lee, W. (author)

    Published in:

    Publication date :

    2010-01-01


    Size :

    104 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692



    High-speed Spectroholographic Parallel Digital Optical Memory

    Shen, X.A. / Nguyen, A.D. / Perry, J. et al. | IEEE | 1997


    High speed test flying

    Yeager, C.E. | Engineering Index Backfile | 1956


    Study on a Parallel Test System Based on Multi-Core

    Wang, L. / Xiao, M. / Xia, R. | British Library Online Contents | 2008


    Serial-parallel connection switching control algorithm for serial-parallel hybrid power system

    YE WEIHONG / ZHU WUXI / WU KUNCHANG et al. | European Patent Office | 2015

    Free access

    Highly scalable serial-parallel optical delay line

    Baby, V. / Lei Xu, / Glesk, I. et al. | IEEE | 2003