A Serial Optical Link Based Memory Test System for High-Speed and Multi-Parallel Test
JOURNAL OF LIGHTWAVE TECHNOLOGY ; 28 , 1/4 ; 104
01.01.2010
104 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.3692 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Study on a Parallel Test System Based on Multi-Core
British Library Online Contents | 2008
|Engineering Index Backfile | 1956
|Serial-parallel connection switching control algorithm for serial-parallel hybrid power system
Europäisches Patentamt | 2015
|Highly scalable serial-parallel optical delay line
IEEE | 2003
|