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    Title :

    Polarization Scanning Ellipsometry Method for Measuring Effective Ellipsometric Parameters of Isotropic and Anisotropic Thin Films


    Contributors:
    Lo, Y.-L. (author) / Chung, Y.-F. (author) / Lin, H.-H. (author)

    Published in:

    JOURNAL OF LIGHTWAVE TECHNOLOGY ; 31 , 14 ; 2361,2369


    Publication date :

    2013-01-01


    Size :

    2 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692



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    Lo, Y.-L. / Hsieh, W.-H. / Chung, Y.-F. et al. | British Library Online Contents | 2012


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    Zhan, Q. / Leger, J. R. / Optical Society of America | British Library Conference Proceedings | 2002


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    Berge, C. / Krasilnikova, A. / Masetti, E. et al. | British Library Conference Proceedings | 2000


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