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    Title :

    Efficacy of Raman mapping over ellipsometric spectroscopy and XRD for characterization of structurally heterogeneous PLD nc-Si thin films


    Contributors:

    Published in:

    Optical materials ; 84 ; 221-226


    Publication date :

    2018-01-01


    Size :

    6 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    Unknown


    Classification :

    DDC:    535




    Ellipsometric studies of the diffusion of automic oxygen through silicon dioxide thin films

    MEYERS, GRANT G. / WOOLLAM, JOHN / GULINO, DANIEL A. et al. | AIAA | 1990


    Ellipsometric studies of the diffusion of automic oxygen through silicon dioxide thin films

    Meyers, Grant G. / Woollam, John / Gulino, Daniel A. et al. | NTRS | 1990


    Raman Spectroscopy for Carbon Based Amorphous Thin Films

    Compagnini, G. / Materials Research Society | British Library Conference Proceedings | 2005