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    Title :

    Two- and three-dimensional vision systems for inspection, control, and metrology : 29 - 30 October 2003, Providence, Rhode Island, USA


    Contributors:

    Conference:

    Conference ; 2003 ; Providence, RI Conference (Providence, RI) : 2003.10.29-30



    Publication date :

    2004


    Size :

    V, 214 S


    Remarks:

    Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek



    Type of media :

    Conference Proceedings


    Type of material :

    Print


    Language :

    English