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    Title :

    The use of physics-of-failure analysis to predict the reliability of semiconductor devices


    Additional title:

    Anwendung der physikalischen Fehleranalyse auf die Voraussage der Zuverlaessigkeit von Halbleitergeraeten.



    Publication date :

    1999


    Size :

    6 pages


    Remarks:

    SAE-Paper;1999-01-0163;1999


    Type of media :

    Miscellaneous


    Type of material :

    Print


    Language :

    English



    The Use of Physics-of-Failure Analysis to Predict the Reliability of Semiconductor Devices

    Knoell, B. / Adams, R. / McCluskey, P. et al. | British Library Conference Proceedings | 1999


    The Use of Physics-of-Failure Analysis to Predict the Reliability of Semiconductor Devices

    Knoell, Bob / McCluskey, Patrick / Adams, Rick | SAE Technical Papers | 1999




    Using PoF models to predict system reliability considering failure collaboration

    Zeng, Zhiguo / Kang, Rui / Chen, Yunxia | British Library Online Contents | 2016