Abnormalities of multiple sensors with redundancy are detected with higher accuracy. A semiconductor device according to the present invention includes: a plurality of internal sensors that detect an identical object to be detected; a switching circuit that switches detection signals from the internal sensors at a predetermined frequency and outputs the signals; a correction information extracting circuit that extracts a first frequency component for correcting the output signal of a predetermined external sensor, from a converted signal based on an output of the switching circuit; and an abnormality information extracting circuit that extracts a second frequency component for detecting abnormalities of the internal sensors, from the converted signal based on the output of the switching circuit.


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    Title :

    SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM, AND AUTOMOBILE


    Contributors:

    Publication date :

    2017-04-27


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    English


    Classification :

    IPC:    G01P MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION OR SHOCK , Messen der Linear- oder Winkelgeschwindigkeit, der Beschleunigung, der Verzögerung oder des Stoßes / B60R Fahrzeuge, Fahrzeugausstattung oder Fahrzeugteile, soweit nicht anderweitig vorgesehen , VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR



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