Abnormalities of multiple sensors with redundancy are detected with higher accuracy. A semiconductor device according to the present invention includes: a plurality of internal sensors that detect an identical object to be detected; a switching circuit that switches detection signals from the internal sensors at a predetermined frequency and outputs the signals; a correction information extracting circuit that extracts a first frequency component for correcting the output signal of a predetermined external sensor, from a converted signal based on an output of the switching circuit; and an abnormality information extracting circuit that extracts a second frequency component for detecting abnormalities of the internal sensors, from the converted signal based on the output of the switching circuit.
SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM, AND AUTOMOBILE
27.04.2017
Patent
Elektronische Ressource
Englisch
IPC: | G01P MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION OR SHOCK , Messen der Linear- oder Winkelgeschwindigkeit, der Beschleunigung, der Verzögerung oder des Stoßes / B60R Fahrzeuge, Fahrzeugausstattung oder Fahrzeugteile, soweit nicht anderweitig vorgesehen , VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR |
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