Measured pulse duration and band-gap scaling of the laser breakdown threshold in oxide dielectrics is explained by multiphoton and impact ionization, and relaxation. Formation of self-trapped excitons on a sub-ps time scale is observed.


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    Title :

    Scaling laws of femtosecond laser induced breakdown in dielectric films


    Contributors:
    Mero, M. (author) / Liu, J. (author) / Sabbah, A.J. (author) / Zeller, J. (author) / Afsing, P.M. (author) / McIver, J.K. (author) / Rudolph, W. (author) / Jasapara, J. (author)


    Publication date :

    2004-01-01


    Size :

    125950 byte



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English





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