A new non-contact measuring technique, which uses a microwave field as the medium, is described. A new kind of microwave photoconductivity spectrometer has been developed, and is used for observing and measuring the photoconductive effect of AgCl, AgBr, CdS, etc. The advantage of this technique is that many characteristics of semiconductors, especially photoconductors can be studied rapidly and accurately. Also real time observation of conductivity variation is possible.


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    Title :

    Microwave photoconductivity spectrometer


    Contributors:
    Kuang Longhai (author) / Kuang Bo (author)


    Publication date :

    1996-01-01


    Size :

    257542 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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