A new non-contact measuring technique, which uses a microwave field as the medium, is described. A new kind of microwave photoconductivity spectrometer has been developed, and is used for observing and measuring the photoconductive effect of AgCl, AgBr, CdS, etc. The advantage of this technique is that many characteristics of semiconductors, especially photoconductors can be studied rapidly and accurately. Also real time observation of conductivity variation is possible.


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    Titel :

    Microwave photoconductivity spectrometer


    Beteiligte:
    Kuang Longhai (Autor:in) / Kuang Bo (Autor:in)


    Erscheinungsdatum :

    01.01.1996


    Format / Umfang :

    257542 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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