A triple-layer omni-directional reflector (ODR), which consists of a semiconductor, a transparent quarter-wavelength dielectric layer, and a metal layer, has high reflectivity at all angles of incidence when used as an internal ODR. In this paper, triple-layer ODRs are demonstrated that incorporate nanoporous SiO/sub 2/, a new low-refractive-index (low-n) material with refractive index /spl Lt/1.46. Internal reflectivity measurements, including the angular dependence of R, are presented. The angle-integrated TE/TM-averaged reflectivity of the triple-layer reflector using nanoporous SiO/sub 2/ is 99.4 %. This is the highest ever reported averaged reflectivity for an internal ODR. The mirror loss of the triple-layer ODR is a factor of 7 lower than the mirror loss of conventional metal reflectors. The results indicate the great potential of the ODR for light-emitting diodes with high light-extraction efficiency.
Internal omni-directional reflector using a low refractive index material for light-emitting diodes
(CLEO). Conference on Lasers and Electro-Optics, 2005. ; 1 ; 144-146 Vol. 1
2005-01-01
1326299 byte
Conference paper
Electronic Resource
English
Internal Omni-Directional Reflector Using a Low Refractive Index Material for Light-Emitting Diodes
British Library Conference Proceedings | 2005
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