Electro-optic sampling (EOS) is a powerful technique for characterization of ultra-fast electronic devices and integrated circuits. To date, it has been thought that the phase noise in mode-locked Ti:sapphire lasers is negligible at high detection frequencies (>1 kHz). In this paper we show that phase noise can have an effect comparable to intensity noise, and show how it is can be suppressed using a combination of two multi-order waveplates.
Phase noise suppression in electro-optic sampling
1999-01-01
201710 byte
Conference paper
Electronic Resource
English
Phase noise suppression in electro-optic sampling
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