Electro-optic sampling (EOS) is a powerful technique for characterization of ultra-fast electronic devices and integrated circuits. To date, it has been thought that the phase noise in mode-locked Ti:sapphire lasers is negligible at high detection frequencies (>1 kHz). In this paper we show that phase noise can have an effect comparable to intensity noise, and show how it is can be suppressed using a combination of two multi-order waveplates.


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    Title :

    Phase noise suppression in electro-optic sampling


    Contributors:
    Zhang, J.M. (author) / Ruo, R. (author) / Jackson, M.K. (author)


    Publication date :

    1999-01-01


    Size :

    201710 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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