Electro-optic sampling (EOS) is a powerful technique for characterization of ultra-fast electronic devices and integrated circuits. To date, it has been thought that the phase noise in mode-locked Ti:sapphire lasers is negligible at high detection frequencies (>1 kHz). In this paper we show that phase noise can have an effect comparable to intensity noise, and show how it is can be suppressed using a combination of two multi-order waveplates.


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    Titel :

    Phase noise suppression in electro-optic sampling


    Beteiligte:
    Zhang, J.M. (Autor:in) / Ruo, R. (Autor:in) / Jackson, M.K. (Autor:in)


    Erscheinungsdatum :

    01.01.1999


    Format / Umfang :

    201710 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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