This paper outlines an approach for monitoring the aging and integrity of circuits using Resistive Random Access Memory (RRAM) devices. The intrinsic properties of these devices can be utilized in conjunction with circuitry to translate device changes over time into readout values relating to the age of the circuit under test (CUT).


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    Title :

    RRAM Devices for Hardware Integrity and Age Monitoring


    Contributors:
    Dewey, Ryan (author) / Jha, Rashmi (author)


    Publication date :

    2023-08-28


    Size :

    1347457 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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