This paper outlines an approach for monitoring the aging and integrity of circuits using Resistive Random Access Memory (RRAM) devices. The intrinsic properties of these devices can be utilized in conjunction with circuitry to translate device changes over time into readout values relating to the age of the circuit under test (CUT).
RRAM Devices for Hardware Integrity and Age Monitoring
2023-08-28
1347457 byte
Conference paper
Electronic Resource
English