This paper outlines an approach for monitoring the aging and integrity of circuits using Resistive Random Access Memory (RRAM) devices. The intrinsic properties of these devices can be utilized in conjunction with circuitry to translate device changes over time into readout values relating to the age of the circuit under test (CUT).
RRAM Devices for Hardware Integrity and Age Monitoring
28.08.2023
1347457 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Thermal flux compression algorithm to enhance RRAM reliability
British Library Online Contents | 2016
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