Demonstrated is a first of a kind hybrid analog-digital laser beam profiler based on a digital micro-mirror device. Tests at 1550 nm show a 2 micron profiling resolution over a 600 micron side square zone.
Reliable super resolution beam profiler for lasers in manufacturing
(CLEO). Conference on Lasers and Electro-Optics, 2005. ; 3 ; 1885-1887 Vol. 3
2005-01-01
1374287 byte
Conference paper
Electronic Resource
English
Reliable Super Resolution Beam Profiler for Lasers in Manufacturing
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