Demonstrated is a first of a kind hybrid analog-digital laser beam profiler based on a digital micro-mirror device. Tests at 1550 nm show a 2 micron profiling resolution over a 600 micron side square zone.


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    Title :

    Reliable super resolution beam profiler for lasers in manufacturing


    Contributors:
    Riza, N.A. (author) / Ghauri, F.N. (author)


    Publication date :

    2005-01-01


    Size :

    1374287 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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