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    Title :

    Failure diagnosis of integrated circuits using ir laser images


    Contributors:
    Keenan, E. (author) / Wright, R.G. (author) / Kirkland, L.V. (author)


    Publication date :

    2003-01-01


    Size :

    1681274 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    7.1203 Failure Diagnosis of Integrated Circuits Using IR Laser Images

    Institute of Electrical and Electronics Engineers | British Library Conference Proceedings | 2003


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