In this paper, a simple optical-beam-induced-current (OBIC) method using Franz-Keldysh (FK) effect is proposed to map the electric fields inside InP substrate. Due to electroabsorption effect, the OBIC by excitation at nearly below bandgap can directly and in-situ maps the electric field inside the substrate.


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    Title :

    Electric field probing by incorporating Franz-Keldysh electroabsorption effect and optical-beam-induced-current technique


    Contributors:


    Publication date :

    2005-01-01


    Size :

    204244 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English