In this paper, a simple optical-beam-induced-current (OBIC) method using Franz-Keldysh (FK) effect is proposed to map the electric fields inside InP substrate. Due to electroabsorption effect, the OBIC by excitation at nearly below bandgap can directly and in-situ maps the electric field inside the substrate.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Electric field probing by incorporating Franz-Keldysh electroabsorption effect and optical-beam-induced-current technique


    Beteiligte:
    Wen-Chin Cheng, (Autor:in) / Yi-Jen Chiu, (Autor:in) / Fu-Jen Kao, (Autor:in)


    Erscheinungsdatum :

    01.01.2005


    Format / Umfang :

    204244 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Electric Field Probing by Incorporating Franz-Keldysh Electrabsorption Effect and Optical-Beam-Induced-Current Technique

    IEEE Lasers and Electro-optics Society | British Library Conference Proceedings | 2005




    Franz-Keldysh effect in an optical waveguide containing a resonant tunneling diode

    McMeekin, S.G. / Taylor, M.R.S. / Vogele, B. et al. | IEEE | 1994