In this paper, we have demonstrated a white-light interferometric technique for characterisation of the dispersion, based on interferograms arising from Fresnel reflections at the sample surfaces. This technique has been shown to yield high-resolution measurements and has the potential for wide application in the characterisation of photonic materials.


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    Title :

    Dispersion measurement by white-light interferometry based on Fresnel reflections


    Contributors:


    Publication date :

    2003-01-01


    Size :

    89908 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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