In this paper, we have demonstrated a white-light interferometric technique for characterisation of the dispersion, based on interferograms arising from Fresnel reflections at the sample surfaces. This technique has been shown to yield high-resolution measurements and has the potential for wide application in the characterisation of photonic materials.
Dispersion measurement by white-light interferometry based on Fresnel reflections
2003-01-01
89908 byte
Conference paper
Electronic Resource
English
Measurement of the group-delay dispersion of optical elements using white-light interferometry
British Library Conference Proceedings | 2003
|Optical sources for white light interferometry
IEEE | 2003
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