In this paper, we have demonstrated a white-light interferometric technique for characterisation of the dispersion, based on interferograms arising from Fresnel reflections at the sample surfaces. This technique has been shown to yield high-resolution measurements and has the potential for wide application in the characterisation of photonic materials.
Dispersion measurement by white-light interferometry based on Fresnel reflections
01.01.2003
89908 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Measurement of the group-delay dispersion of optical elements using white-light interferometry
British Library Conference Proceedings | 2003
|Optical sources for white light interferometry
IEEE | 2003
|