In this paper, we have demonstrated a white-light interferometric technique for characterisation of the dispersion, based on interferograms arising from Fresnel reflections at the sample surfaces. This technique has been shown to yield high-resolution measurements and has the potential for wide application in the characterisation of photonic materials.


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    Titel :

    Dispersion measurement by white-light interferometry based on Fresnel reflections


    Beteiligte:
    Rothwell, J.H. (Autor:in) / Flavin, D.A. (Autor:in)


    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    89908 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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