Since 1992, we have tested 980 nm laser diodes from three manufacturers, in pumps fabricated by four packagers, for reliability and fitness for use in Er-doped optical fiber amplifiers. We have found that when high-power 980 nm lasers are hermetically sealed in inert gas, regardless of laser or package origin, a large number experience a catastrophic failure mode that apparently does not occur in lasers that are lifetested as chip-on-carrier. We call this phenomenon packaging-induced failure.


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    Title :

    Reliability of hermetically packaged 980 nm diode lasers


    Contributors:

    Published in:

    Proceedings of LEOS'94 ; 2 ; 35-36 vol.2


    Publication date :

    1994-01-01


    Size :

    320957 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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