Since 1992, we have tested 980 nm laser diodes from three manufacturers, in pumps fabricated by four packagers, for reliability and fitness for use in Er-doped optical fiber amplifiers. We have found that when high-power 980 nm lasers are hermetically sealed in inert gas, regardless of laser or package origin, a large number experience a catastrophic failure mode that apparently does not occur in lasers that are lifetested as chip-on-carrier. We call this phenomenon packaging-induced failure.


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    Titel :

    Reliability of hermetically packaged 980 nm diode lasers


    Beteiligte:
    Sharps, J.A. (Autor:in)

    Erschienen in:

    Proceedings of LEOS'94 ; 2 ; 35-36 vol.2


    Erscheinungsdatum :

    01.01.1994


    Format / Umfang :

    320957 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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