Imaging technique may be used in series with flat or conical Bragg crystals to separate spatial/spectral convolution when spectrometer is scanned across extended source emitting at more than one wavelength. Technique allows line direction and continuum to be detected and provides data for spatial mapping of source.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Shadow mask for X-ray spectrometer


    Contributors:

    Published in:

    Publication date :

    1977-01-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




    Jig Aligns Shadow Mask On CCD

    Matus, Carlos V. | NTRS | 1989


    Techniques for shadow mask deposition of nonplanar dielectric layers

    Blickenstaff, S.B. / Nelson, T.R. / Sarangan, A.M. | IEEE | 2003


    Techniques for Shadow Mask Deposition of Non-Planar Dielectric Layers

    IEEE | British Library Conference Proceedings | 2003


    Fault Detection of Shadow Mask by Use of Correlation Technique

    Sakata, M. / Kashiwagi, H. | British Library Online Contents | 1995


    A high-brightness shadow-mask color CRT for cockpit displays

    Robinder, R.C. / Bates, D.J. / Green, P.J. et al. | Tema Archive | 1983