Common experimental errors reduced because pulse technique suppresses drifts in thermoelectric measurements. Differential-heat-pulse apparatus measures Seebeck coefficient in semiconductors at temperatures up to 1,900 K. Sample heated to measuring temperature in furnace. Ends of sample then differentially heated a few degrees more by lamps. Differential temperature rise and consequent Seebeck voltage measured via thermocouple leads. Because pulse technique used, errors that often arise from long-term drifts in thermoelectric measurements suppressed. Apparatus works with temperature differences of only few degrees, further increasing accuracy of coefficients obtained.


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    Title :

    Seebeck Coefficient Measured With Differential Heat Pulses


    Contributors:
    Zoltan, L. (author) / Wood, C. (author) / Stapfer, G. (author)

    Published in:

    Publication date :

    1986-06-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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