Common experimental errors reduced because pulse technique suppresses drifts in thermoelectric measurements. Differential-heat-pulse apparatus measures Seebeck coefficient in semiconductors at temperatures up to 1,900 K. Sample heated to measuring temperature in furnace. Ends of sample then differentially heated a few degrees more by lamps. Differential temperature rise and consequent Seebeck voltage measured via thermocouple leads. Because pulse technique used, errors that often arise from long-term drifts in thermoelectric measurements suppressed. Apparatus works with temperature differences of only few degrees, further increasing accuracy of coefficients obtained.


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    Titel :

    Seebeck Coefficient Measured With Differential Heat Pulses


    Beteiligte:
    Zoltan, L. (Autor:in) / Wood, C. (Autor:in) / Stapfer, G. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.06.1986



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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