Bipolar integrated circuits more resistant to ionizing radiation. Tests show resistance of bipolar integrated logic or memory circuit by single-event upsets increased by imparting forward bias to diode constituted by buried layer of substrate and collector.


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    Title :

    Forward Bias Inhibits Single-Event Upsets


    Contributors:

    Published in:

    Publication date :

    1990-04-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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