This paper describes an overview of the precision environment test enclosure for testing the structures, a metrology system for absolute measurement at the micron level and the formulation of a modeling methodology that integrates the measurement of aperture components or subsystems w1th models for direct validation.


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    Title :

    A Precision Deployable Aperture System Facility


    Contributors:
    Cwik, Tom (author) / Agnes, Greg (author) / Moussessian, Alina (author) / Norton, Charles (author) / Zhao, Feng (author)

    Conference:

    IEEE Aerospace Conference ; 2007 ; Big Sky, MT, United States


    Publication date :

    2007-03-03


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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