This paper describes an overview of the precision environment test enclosure for testing the structures, a metrology system for absolute measurement at the micron level and the formulation of a modeling methodology that integrates the measurement of aperture components or subsystems w1th models for direct validation.


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    Titel :

    A Precision Deployable Aperture System Facility


    Beteiligte:
    Cwik, Tom (Autor:in) / Agnes, Greg (Autor:in) / Moussessian, Alina (Autor:in) / Norton, Charles (Autor:in) / Zhao, Feng (Autor:in)

    Kongress:

    IEEE Aerospace Conference ; 2007 ; Big Sky, MT, United States


    Erscheinungsdatum :

    03.03.2007


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch




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