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    Title :

    The SCaN Testbed on the International Space Station (ISS)


    Contributors:
    Lux, James (author)

    Conference:

    IEEE International Microwave Symposium 2011 ; 2011 ; Baltimore, MD, United States


    Publication date :

    2011-06-10


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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