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    Title :

    Risk-Driven and Mitigation-Focused SEFI Testing of NAND Flash Devices


    Contributors:
    Ted Wilcox (author) / Matt Joplin (author) / Michael Campola (author)

    Conference:

    SEE-MAPLD Single Event Effects (SEE) Symposium/Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2022 ; La Jolla (San Diego), CA, US



    Publication date :

    2022-05-16


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English





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