Failure modes are investigated for linear integrated circuits, including op-amps that are embedded within more complex circuit functions. The specific techniques used in internal circuit design have a large impact on the radiation sensitivity of various device parameters, which makes it difficult to generalize conclusions about failure mechanisms. Loading and bias conditions can be critically important for some devices, and have a large impact on hardness assurance.


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    Title :

    Failure Modes and Hardness Assurance for Linear Integrated Circuits in Space Applications


    Contributors:

    Published in:

    Publication date :

    2010


    Size :

    7 Seiten, 16 Quellen




    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




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