Failure modes are investigated for linear integrated circuits, including op-amps that are embedded within more complex circuit functions. The specific techniques used in internal circuit design have a large impact on the radiation sensitivity of various device parameters, which makes it difficult to generalize conclusions about failure mechanisms. Loading and bias conditions can be critically important for some devices, and have a large impact on hardness assurance.
Failure Modes and Hardness Assurance for Linear Integrated Circuits in Space Applications
IEEE Transactions on Nuclear Science ; 57 , 4 ; 1966-1972
2010
7 Seiten, 16 Quellen
Article (Journal)
English
Optocouplers: fundamentals and hardness assurance for space applications
Tema Archive | 2009
|Radiation Hardness Assurance (RHA) for Space Systems
NTRS | 2008
|SAE Technical Papers | 2021
Avionics Radiation Hardness Assurance (RHA) Guidelines
NTIS | 2021
|