Failure modes are investigated for linear integrated circuits, including op-amps that are embedded within more complex circuit functions. The specific techniques used in internal circuit design have a large impact on the radiation sensitivity of various device parameters, which makes it difficult to generalize conclusions about failure mechanisms. Loading and bias conditions can be critically important for some devices, and have a large impact on hardness assurance.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Failure Modes and Hardness Assurance for Linear Integrated Circuits in Space Applications


    Beteiligte:
    Johnston, Allan H. (Autor:in) / Rax, B.G. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2010


    Format / Umfang :

    7 Seiten, 16 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch




    Optocouplers: fundamentals and hardness assurance for space applications

    Johnston, A.H. / Harris, R.D. / Miyahira, T.F. | Tema Archiv | 2009



    Radiation Hardness Assurance

    SAE Technical Papers | 2021



    Avionics Radiation Hardness Assurance (RHA) Guidelines

    R. F. Hodson / J. A. Pellish / R. A. Austin et al. | NTIS | 2021