The aim of this contribution is to present and discuss an methodology for the development/design and the reliability/quality assurance of advanced application specific integrated circuits for digital, analog and microwave space applications. Starting from the technical and managerial requirements of space projects, the presentations shows today's procedure to fly advanced microelectronics. Areas of potential improvements or revisions are identified to reach an approach that would be more compatible with the fast technological and industrial evolution in space industry. Various activities of the design/development and quality/reliability assurance are addressed and illustrated. Study cases are presented on reliability prediction, failure mode effects analyses, definition of safe operating conditions, process evaluation and parts selection. The presentation draws some conclusions about the technical and managerial trends.


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    Reliability of integrated circuits modified by focused ion beam for space applications

    Desplats, R. / Courrege, J. C. / Benteo, B. et al. | British Library Conference Proceedings | 2002


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