Reliability of integrated circuits modified by focused ion beam for space applications
European space components conference ; 2002 ; Toulouse, France
2002-01-01
10 pages
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Reliability of integrated circuits modified by focused ion beam for space applications
Tema Archive | 2002
|High reliability circuits for space applications
Tema Archive | 1995
|Study on the method for the reliability test of focused ion beam
British Library Online Contents | 2007
|