Single event latchup is one of the dominant CMOS IC failure effects in the space environment. Latchup comparative experimental and software simulation research were performed at various laser wavelengths, pulse durations and spot sizes. Single event to dose rate latchup correlation was found that provides the possibility of SEL threshold energy prediction based on laser dose rate test results.


    Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Single event latchup threshold estimation based on laser dose rate test results


    Contributors:


    Publication date :

    1997


    Size :

    6 Seiten, 9 Quellen




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Latent damage from single-event latchup

    Becker, H. N. / Miyahira, T. F. / Johnston, A. H. | NTRS | 2002


    Single Event Latchup Protection of Integrated Circuits

    Layton, P. / Marshall, J. / Czajkowski, D. et al. | British Library Conference Proceedings | 1997


    Single Event Latchup Protection of Integrated Circuits

    Layton, P. / Marshall, J. / Czajkowski, D. et al. | British Library Online Contents | 1997


    Single Event Latchup Results for COTS Devices Used on SmallSat Missions

    Parker, Wilson / Allen, Gregory / Irom, Farokh et al. | NTRS | 2020