This paper reports recent single-event latchup (SEL) results for a variety of microelectronic devices that include OpAmp, Voltage Reference, Motor Controller, Switch Mode Controller, Resolver-to-Digital Converter and Analog-to-Digital Converter. The data was collected to evaluate these devices for possible use in NASA spacecraft.
Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion Laboratory
European Conference on Radiation and Its Effects on Components and Systems (RADECS 2010) ; 2010 ; Langenfeld, Austria
2010-09-20
Conference paper
No indication
English