This paper reports recent single-event latchup (SEL) results for a variety of microelectronic devices that include OpAmp, Voltage Reference, Motor Controller, Switch Mode Controller, Resolver-to-Digital Converter and Analog-to-Digital Converter. The data was collected to evaluate these devices for possible use in NASA spacecraft.


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    Title :

    Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion Laboratory


    Contributors:

    Conference:

    European Conference on Radiation and Its Effects on Components and Systems (RADECS 2010) ; 2010 ; Langenfeld, Austria


    Publication date :

    2010-09-20


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English







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