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    Titel :

    Understanding infrared clutter through fixation point analysis (Invited Paper) [2223-10]


    Beteiligte:

    Kongress:

    Conference, Characterization and propagation of sources and backgrounds ; 1994 ; Orlando; FL



    Erscheinungsdatum :

    01.01.1994


    Format / Umfang :

    13 pages


    Anmerkungen:

    Held as part of the Atmospheric Imaging Program in SPIE's International symposium on optical engineering in aerospace sensing




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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