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    Titel :

    Comparison of rigorous methods for x-ray and XUV grating diffraction analysis [2515-30]



    Kongress:

    Conference, X-ray and extreme ultraviolet optics ; 1995 ; San Diego; CA



    Erscheinungsdatum :

    01.01.1995


    Format / Umfang :

    6 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Nr. 2515

    DataCite | 1893


    Transmission grating filtering and polarization characteristics in EUV [2515-29]

    Gruntman, M. A. / SPIE | British Library Conference Proceedings | 1995


    Structural analysis of multilayered x-ray mirrors by x-ray diffraction [2515-20]

    Kim, D.-E. / Cha, D.-H. / SPIE | British Library Conference Proceedings | 1995


    X-ray focusing by polycapillary arrays [2515-55]

    Arkadiev, V. A. / Kurchatov, I. V. / Bzhaumikhov, A. A. et al. | British Library Conference Proceedings | 1995


    Rigorous coupled-wave analysis and applications of grating diffraction

    Glytsis, E. N. / Gaylord, T. K. / Brundrett, D. L. et al. | British Library Conference Proceedings | 1994