Two-wave x-ray methods for characterization of supersmooth substrates and thin films [3773-20]
Conference, X-ray optics designs, performance, and applications ; 1999 ; Denver; CO
01.01.1999
13 pages
Aufsatz (Konferenz)
Englisch
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DataCite | 1917
Characteristics of the thin crystal spectrometer [3773-22]
British Library Conference Proceedings | 1999
|Laterally graded multilayer double-monochromator [3773-14]
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|Design and performance of graded multilayers [3773-13]
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|SPring-8 standard x-ray monochromators [3773-03]
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