Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Comparison of nondestructive and noninvasive material depth profiling using FT-Raman fiber optics and microspectroscopy [4129-32]



    Kongress:

    Conference; 2nd, Subsurface sensing technologies and applications ; 2000 ; San Diego, CA



    Erscheinungsdatum :

    01.01.2000


    Format / Umfang :

    10 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Nondestructive detection of defects in materials using microwaves [4129-03]

    Glay, D. / Lasri, T. / Mamouni, A. et al. | British Library Conference Proceedings | 2000


    Confocal Raman microscopy for the depth profiling of polymer/polymer and polymer/glass interfaces (Invited Paper) [4129-30]

    Sammon, C. / Eaton, P. / Mura, C. et al. | British Library Conference Proceedings | 2000


    Nr. 4129

    DataCite | 1924


    Spectrographic evaluation of patch test reactions by NIR FT Raman spectroscopy [4129-27]

    Skrebova, N. / International Society for Optical Engineering | British Library Conference Proceedings | 2000


    Multifrequency EM image system [4129-40]

    Zhang, Q. / Chen, X. / Jiang, X. et al. | British Library Conference Proceedings | 2000