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    Titel :

    Multilayer grating for the Extreme Ultraviolet Spectrometer (EIS) (Invited Paper) [4138-24]



    Kongress:

    Conference; 4th, X-ray optics, instruments, and missions ; 2000 ; San Diego, CA



    Erscheinungsdatum :

    01.01.2000


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Grazing incidence flat-field spectrometer with spatial resolution capability for extended sources (Invited Paper) [4138-25]

    Poletto, L. / Tondello, G. / International Society for Optical Engineering | British Library Conference Proceedings | 2000


    Development of a balloonborne hard x-ray telescope using multilayer supermirror (Invited Paper) [4138-18]

    Tamura, K. / Yamashita, K. / Tawara, Y. et al. | British Library Conference Proceedings | 2000


    Precision assembly station for high-resolution segmented optics (Invited Paper) [4138-20]

    Bergner, H. W. / Cohen, L. M. / Schattenburg, M. L. et al. | British Library Conference Proceedings | 2000


    Development of soft and hard x-ray optics for astronomy (Invited Paper) [4138-09]

    Citterio, O. / Conconi, P. / Ghigo, M. et al. | British Library Conference Proceedings | 2000


    advect.4138.err

    Pollinger, Theresa | DataCite | 2022