Defect Identification With Model-Based Test Automation
Session, Testing and instrumentation 2003 ; 2003 ; Detroit, MI
01.01.2003
8 pages
Paper nos 2003-01-1024 to 2003-01-1037 with gaps. Held during the SAE 2003 World Congress
Aufsatz (Konferenz)
Englisch
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Defect Identification With Model-Based Test Automation
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