Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Reliability test procedures for tunable lasers (Invited Paper) [4944-09]



    Kongress:

    Conference, Integrated optical devices: fabrication and testing ; 2002 ; Brugge, Belgium



    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    14 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    SiON technology for integrated optical sensors (Invited Paper) [4944-23]

    Lambeck, P. V. / Worhoff, K. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Integrated optical DBR- and DFB-lasers in Er:LiNbO~3 with photorefractive gratings (Invited Paper) [4944-05]

    Das, B. K. / Becker, C. / Oesselke, T. et al. | British Library Conference Proceedings | 2003


    Nr. 4944

    DataCite | 1940


    Fabrication and characterization of waveguide structures on SOI (Invited Paper) [4944-22]

    Aalto, T. T. / Heimala, P. / Yliniemi, S. et al. | British Library Conference Proceedings | 2003


    Glass ion-exchange technology for wavelength management applications (Invited Paper) [4944-18]

    Ruschin, S. / Hurwitz, G. / Hurwitz, T. et al. | British Library Conference Proceedings | 2003